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"Hierarchical test generation under architectural level functional constraints."

Jaushin Lee, Janak H. Patel (1996)

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DOI: 10.1109/43.536720

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/LeeP96
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  - https://dblp.org/rec/journals/tcad/LeeP96
Jaushin Lee, Janak H. Patel:
Hierarchical test generation under architectural level functional constraints. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(9): 1144-1151 (1996)

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