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"An optimal test compression procedure for combinational circuits."

Dorit S. Hochbaum (1996)

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DOI: 10.1109/43.541449

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - https://dblp.org/rec/journals/tcad/Hochbaum96
Dorit S. Hochbaum:
An optimal test compression procedure for combinational circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 15(10): 1294-1299 (1996)

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