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"On Detection of Resistive Bridging Defects by Low-Temperature and ..."

Piet Engelke et al. (2008)

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DOI: 10.1109/TCAD.2007.913382

access: closed

type: Journal Article

metadata version: 2023-03-21

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Piet Engelke, Ilia Polian, Michel Renovell, Sandip Kundu, Bharath Seshadri, Bernd Becker:
On Detection of Resistive Bridging Defects by Low-Temperature and Low-Voltage Testing. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 27(2): 327-338 (2008)

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