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"An Improved Method for Detecting Functional Faults in Semiconductor Random ..."

Christos A. Papachristou, Narendar B. Sahgal (1985)

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DOI: 10.1109/TC.1985.1676547

access: closed

type: Journal Article

metadata version: 2017-05-20

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  persistent URL:
  - https://dblp.org/rec/journals/tc/PapachristouS85
Christos A. Papachristou, Narendar B. Sahgal:
An Improved Method for Detecting Functional Faults in Semiconductor Random Access Memories. IEEE Trans. Computers 34(2): 110-116 (1985)

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