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"An Erase Efficiency Boosting Strategy for 3D Charge Trap NAND Flash."

Shuo-Han Chen et al. (2018)

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DOI: 10.1109/TC.2018.2818118

access: closed

type: Journal Article

metadata version: 2021-01-05

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  dblp key:
  - journals/tc/ChenCLWS18
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  persistent URL:
  - https://dblp.org/rec/journals/tc/ChenCLWS18
Shuo-Han Chen, Yuan-Hao Chang, Yu-Pei Liang, Hsin-Wen Wei, Wei-Kuan Shih:
An Erase Efficiency Boosting Strategy for 3D Charge Trap NAND Flash. IEEE Trans. Computers 67(9): 1246-1258 (2018)

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