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ORCID"Built-in current testing for CMOS logic circuits using random patterns."
Hiroshi Yokoyama, Hideo Tamamoto, Yuichi Narita (1994)
- Hiroshi Yokoyama, Hideo Tamamoto, Yuichi Narita:
Built-in current testing for CMOS logic circuits using random patterns. Syst. Comput. Jpn. 25(11): 1-10 (1994)
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