"Test cost reduction for logic circuits: Reduction of test data volume and ..."

Yoshinobu Higami et al. (2005)

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DOI: 10.1002/SCJ.20240

access: closed

type: Journal Article

metadata version: 2023-09-13

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Yoshinobu Higami, Seiji Kajihara, Hideyuki Ichihara, Yuzo Takamatsu:
Test cost reduction for logic circuits: Reduction of test data volume and test application time. Syst. Comput. Jpn. 36(6): 69-83 (2005)

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