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"Cross Validation Through Two-Dimensional Solution Surface for ..."

Bin Gu et al. (2017)

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DOI: 10.1109/TPAMI.2016.2578326

access: closed

type: Journal Article

metadata version: 2021-12-01

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/journals/pami/GuSTRL17
Bin Gu, Victor S. Sheng, KengYeow Tay, Walter Romano, Shuo Li:
Cross Validation Through Two-Dimensional Solution Surface for Cost-Sensitive SVM. IEEE Trans. Pattern Anal. Mach. Intell. 39(6): 1103-1121 (2017)

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