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"Reliability assessment of the metallized film capacitors from degradation ..."

Jianyin Zhao, Fang Liu (2007)

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DOI: 10.1016/J.MICROREL.2006.05.013

access: closed

type: Journal Article

metadata version: 2020-02-22

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Jianyin Zhao, Fang Liu:
Reliability assessment of the metallized film capacitors from degradation data. Microelectron. Reliab. 47(2-3): 434-436 (2007)

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