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"Gate length dependence of bias temperature instability behavior in short ..."
Wangran Wu et al. (2016)
- Wangran Wu, J. Lu, Chang Liu, Heng Wu, Xiaoyu Tang, Jiabao Sun, Rui Zhang, Wenjie Yu, Xi Wang, Yi Zhao:
Gate length dependence of bias temperature instability behavior in short channel SOI MOSFETs. Microelectron. Reliab. 62: 79-81 (2016)
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