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"Introducing a scale structure to correlate quality and reliability."

William J. Roesch, Dorothy June M. Hamada, David Littleton (2012)

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DOI: 10.1016/J.MICROREL.2011.09.007

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/RoeschHL12
William J. Roesch, Dorothy June M. Hamada, David Littleton:
Introducing a scale structure to correlate quality and reliability. Microelectron. Reliab. 52(1): 16-22 (2012)

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