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"Soft breakdown and hard breakdown in ultra-thin oxides."

T. Pompl et al. (2001)

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DOI: 10.1016/S0026-2714(00)00253-5

access: closed

type: Journal Article

metadata version: 2020-10-09

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T. Pompl, C. Engel, H. Wurzer, Martin Kerber:
Soft breakdown and hard breakdown in ultra-thin oxides. Microelectron. Reliab. 41(4): 543-551 (2001)

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