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"Electrical characterization and reliability of submicron SOI CMOS ..."
Konstantin O. Petrosyants et al. (2017)
- Konstantin O. Petrosyants, Igor A. Kharitonov, Sergey V. Lebedev, Lev M. Sambursky, Sergey O. Safonov, Veniamin G. Stakhin:
Electrical characterization and reliability of submicron SOI CMOS technology in the extended temperature range (to 300 °C). Microelectron. Reliab. 79: 416-425 (2017)
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