"Direct observation of changes in the effective minority-carrier lifetime ..."

Naoyuki Nishikawa, Seira Yamaguchi, Keisuke Ohdaira (2017)

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DOI: 10.1016/J.MICROREL.2017.10.012

access: closed

type: Journal Article

metadata version: 2020-10-26

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Naoyuki Nishikawa, Seira Yamaguchi, Keisuke Ohdaira:
Direct observation of changes in the effective minority-carrier lifetime of SiN_x-passivated n-type crystalline-silicon substrates caused by potential-induced degradation and recovery tests. Microelectron. Reliab. 79: 91-95 (2017)

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