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"Radiation source dependence of performance degradation in thin gate oxide ..."

Kiyoteru Hayama et al. (2005)

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DOI: 10.1016/J.MICROREL.2005.07.024

access: closed

type: Journal Article

metadata version: 2020-02-22

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Kiyoteru Hayama, Kenichiro Takakura, Hidenori Ohyama, S. Kuboyama, S. Matsuda, Joan Marc Rafí, Abdelkarim Mercha, Eddy Simoen, Cor Claeys:
Radiation source dependence of performance degradation in thin gate oxide fully-depleted SOI n-MOSFETs. Microelectron. Reliab. 45(9-11): 1376-1381 (2005)

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