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"Test and study on sensitivity of electronic circuit in low-voltage release ..."

Sen Ouyang, Liyuan Liu (2017)

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DOI: 10.1049/IET-CDS.2016.0222

access: closed

type: Journal Article

metadata version: 2020-09-10

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Sen Ouyang, Liyuan Liu:
Test and study on sensitivity of electronic circuit in low-voltage release to voltage sags. IET Circuits Devices Syst. 11(6): 529-534 (2017)

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