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"An Approach for Reducing Leakage Current Variation due to Manufacturing ..."

Tsuyoshi Sakata et al. (2009)

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DOI: 10.1587/TRANSFUN.E92.A.3016

access: closed

type: Journal Article

metadata version: 2022-01-03

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  dblp key:
  - journals/ieicet/SakataOKNMSHHFTTK09
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  persistent URL:
  - https://dblp.org/rec/journals/ieicet/SakataOKNMSHHFTTK09
Tsuyoshi Sakata, Takaaki Okumura, Atsushi Kurokawa, Hidenari Nakashima, Hiroo Masuda, Takashi Sato, Masanori Hashimoto, Koutaro Hachiya, Katsuhiro Furukawa, Masakazu Tanaka, Hiroshi Takafuji, Toshiki Kanamoto:
An Approach for Reducing Leakage Current Variation due to Manufacturing Variability. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 92-A(12): 3016-3023 (2009)

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