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"Evaluation of Information Leakage from Cryptographic Hardware via ..."

Yu-ichi Hayashi et al. (2012)

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DOI: 10.1587/TRANSELE.E95.C.1089

access: closed

type: Journal Article

metadata version: 2022-08-26

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  - https://dblp.org/rec/journals/ieicet/HayashiHMSKAMSSI12
Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takeshi Sugawara, Yoshiki Kayano, Takafumi Aoki, Shigeki Minegishi, Akashi Satoh, Hideaki Sone, Hiroshi Inoue:
Evaluation of Information Leakage from Cryptographic Hardware via Common-Mode Current. IEICE Trans. Electron. 95-C(6): 1089-1097 (2012)

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