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"Hypersphere Sampling for Accelerating High-Dimension and Low-Failure ..."

Shiho Hagiwara et al. (2014)

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DOI: 10.1587/TRANSELE.E97.C.280

access: closed

type: Journal Article

metadata version: 2024-05-07

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  - https://dblp.org/rec/journals/ieicet/HagiwaraDMS14
Shiho Hagiwara, Takanori Date, Kazuya Masu, Takashi Sato:
Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis. IEICE Trans. Electron. 97-C(4): 280-288 (2014)

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