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"A Realistic Timing Test Model and Its Applications in High-Speed ..."

Baosheng Wang et al. (2005)

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DOI: 10.1007/S10836-005-4819-4

access: closed

type: Journal Article

metadata version: 2020-09-11

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Baosheng Wang, Andy Kuo, Touraj Farahmand, André Ivanov, Yong B. Cho, Sassan Tabatabaei:
A Realistic Timing Test Model and Its Applications in High-Speed Interconnect Devices. J. Electron. Test. 21(6): 621-630 (2005)

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