"Defect Simulation Methodology for i_DDT Testing."

Abhishek Singh et al. (2006)

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DOI: 10.1007/S10836-006-9318-8

access: closed

type: Journal Article

metadata version: 2020-09-11

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Abhishek Singh, Jim Plusquellic, Dhananjay S. Phatak, Chintan Patel:
Defect Simulation Methodology for i_DDT Testing. J. Electron. Test. 22(3): 255-272 (2006)

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