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"BIST to Detect and Characterize Transient and Parametric Failures."
Alodeep Sanyal, Syed M. Alam, Sandip Kundu (2010)
- Alodeep Sanyal, Syed M. Alam, Sandip Kundu:
BIST to Detect and Characterize Transient and Parametric Failures. IEEE Des. Test Comput. 27(5): 50-59 (2010)
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