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"Variability and Reliability Awareness in the Age of Dark Silicon."

Florian Kriebel et al. (2016)

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DOI: 10.1109/MDAT.2015.2439640

access: closed

type: Journal Article

metadata version: 2020-12-29

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  dblp key:
  - journals/dt/KriebelSRHG16
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  persistent URL:
  - https://dblp.org/rec/journals/dt/KriebelSRHG16
Florian Kriebel, Muhammad Shafique, Semeen Rehman, Jörg Henkel, Siddharth Garg:
Variability and Reliability Awareness in the Age of Dark Silicon. IEEE Des. Test 33(2): 59-67 (2016)

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