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"On Improving Interconnect Defect Diagnosis Resolution and Yield for ..."

Chun-Chuan Chi et al. (2014)

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DOI: 10.1109/MDAT.2014.2304437

access: closed

type: Journal Article

metadata version: 2023-09-30

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Chun-Chuan Chi, Bing-Yang Lin, Cheng-Wen Wu, Min-Jer Wang, Hung-Chih Lin, Ching-Nen Peng:
On Improving Interconnect Defect Diagnosis Resolution and Yield for Interposer-Based 3-D ICs. IEEE Des. Test 31(4): 16-26 (2014)

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