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"Bayesian Deconvolution of Scanning Electron Microscopy Images Using ..."
Joris Roels et al. (2018)
- Joris Roels, Jan Aelterman, Jonas De Vylder, Hiêp Quang Luong, Yvan Saeys, Wilfried Philips:
Bayesian Deconvolution of Scanning Electron Microscopy Images Using Point-spread Function Estimation and Non-local Regularization. CoRR abs/1810.09739 (2018)
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