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"Scan BIST with biased scan test signals."

Dong Xiang, Mingjing Chen, Jia-Guang Sun (2008)

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DOI: 10.1007/S11432-008-0078-1

access: closed

type: Journal Article

metadata version: 2020-05-18

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  dblp key:
  - journals/chinaf/XiangCS08
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  - https://dblp.org/rec/journals/chinaf/XiangCS08
Dong Xiang, Mingjing Chen, Jia-Guang Sun:
Scan BIST with biased scan test signals. Sci. China Ser. F Inf. Sci. 51(7): 881-895 (2008)

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