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"Standardization and modularization driven by minimizing overall process ..."

Yuval Sered, Yoram Reich (2006)

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DOI: 10.1016/J.CAD.2005.11.005

access: closed

type: Journal Article

metadata version: 2020-02-13

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Yuval Sered, Yoram Reich:
Standardization and modularization driven by minimizing overall process effort. Comput. Aided Des. 38(5): 405-416 (2006)

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