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"Partitioning Circuits for Improved Testability."

Sandeep N. Bhatt, Fan R. K. Chung, Arnold L. Rosenberg (1991)

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DOI: 10.1007/BF01759033

access: closed

type: Journal Article

metadata version: 2017-05-17

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  - journals/algorithmica/BhattCR91
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  - https://dblp.org/rec/journals/algorithmica/BhattCR91
Sandeep N. Bhatt, Fan R. K. Chung, Arnold L. Rosenberg:
Partitioning Circuits for Improved Testability. Algorithmica 6(1): 37-48 (1991)

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