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"Power-aware test generation with guaranteed launch safety for at-speed ..."
Xiaoqing Wen et al. (2011)
- Xiaoqing Wen, Kazunari Enokimoto, Kohei Miyase, Yuta Yamato, Michael A. Kochte, Seiji Kajihara, Patrick Girard, Mohammad Tehranipoor:
Power-aware test generation with guaranteed launch safety for at-speed scan testing. VTS 2011: 166-171
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