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"Test preparation for high coverage of physical defects in CMOS digital ICs."

Marcelino B. Santos et al. (1995)

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DOI: 10.1109/VTEST.1995.512657

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/SantosSTT95
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  persistent URL:
  - https://dblp.org/rec/conf/vts/SantosSTT95
Marcelino B. Santos, M. Simões, Isabel C. Teixeira, João Paulo Teixeira:
Test preparation for high coverage of physical defects in CMOS digital ICs. VTS 1995: 330-337

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