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ORCID"Low-Cost Scan-Based Delay Testing of Latch-Based Circuits with Time Borrowing."
Kun Young Chung, Sandeep K. Gupta (2006)
- Kun Young Chung, Sandeep K. Gupta:
Low-Cost Scan-Based Delay Testing of Latch-Based Circuits with Time Borrowing. VTS 2006: 8-15
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