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"Sequential Circuits with combinational Test Generation Complexity."

Arun Balakrishnan, Srimat T. Chakradhar (1996)

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DOI: 10.1109/ICVD.1996.489468

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/vlsid/BalakrishnanC96
Arun Balakrishnan, Srimat T. Chakradhar:
Sequential Circuits with combinational Test Generation Complexity. VLSI Design 1996: 111-117

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