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"Deterministic identity testing of depth-4 multilinear circuits with ..."

Zohar Shay Karnin et al. (2010)

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DOI: 10.1145/1806689.1806779

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-26

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  - conf/stoc/KarninMSV10
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Zohar Shay Karnin, Partha Mukhopadhyay, Amir Shpilka, Ilya Volkovich:
Deterministic identity testing of depth-4 multilinear circuits with bounded top fan-in. STOC 2010: 649-658

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