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ORCID"Proceedings of the International Conference on Measurements and Modeling ..."
Derek L. Eager et al. (2005)
- Derek L. Eager, Carey L. Williamson, Sem C. Borst, John C. S. Lui:
Proceedings of the International Conference on Measurements and Modeling of Computer Systems, SIGMETRICS 2005, June 6-10, 2005, Banff, Alberta, Canada. ACM 2005, ISBN 1-59593-022-1 [contents]
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