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"Augmenting sensitivity analysis for embedded applications by program level ..."

Dieter Zöbel, Christian Weyand (2007)

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DOI: 10.1109/SIES.2007.4297312

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Dieter Zöbel, Christian Weyand:
Augmenting sensitivity analysis for embedded applications by program level derivation of process parameters. SIES 2007: 17-24

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