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"Power Dissipation Associated to Internal Effect Transitions in Static CMOS ..."

Alejandro Millán et al. (2008)

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DOI: 10.1007/978-3-540-95948-9_39

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-21

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  - conf/patmos/MillanJBGRV08
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Alejandro Millán, Jorge Juan, Manuel J. Bellido, David Guerrero Martos, Paulino Ruiz-de-Clavijo, Julian Viejo:
Power Dissipation Associated to Internal Effect Transitions in Static CMOS Gates. PATMOS 2008: 389-398

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