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"Improving nanoelectronic designs using a statistical approach to identify ..."

Drew C. Ness, Christian J. Hescott, David J. Lilja (2007)

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DOI: 10.1109/NANOARCH.2007.4400857

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Drew C. Ness, Christian J. Hescott, David J. Lilja:
Improving nanoelectronic designs using a statistical approach to identify key parameters in circuit level SEU simulations. NANOARCH 2007: 46-53

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