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"Universal Pattern: Formalization, Testing, Coverage, Verification, and ..."

Tino Teige, Tom Bienmüller, Hans Jürgen Holberg (2016)

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DOI: 10.6094/UNIFR/10633

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-24

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  dblp key:
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  - https://dblp.org/rec/conf/mbmv/TeigeBH16
Tino Teige, Tom Bienmüller, Hans Jürgen Holberg:
Universal Pattern: Formalization, Testing, Coverage, Verification, and Test Case Generation for Safety-Critical Requirements. MBMV 2016: 6-9

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