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"Finding similar defects using synonymous identifier retrieval."

Norihiro Yoshida, Takeshi Hattori, Katsuro Inoue (2010)

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DOI: 10.1145/1808901.1808908

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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  dblp key:
  - conf/iwsc/YoshidaHI10
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  - https://dblp.org/rec/conf/iwsc/YoshidaHI10
Norihiro Yoshida, Takeshi Hattori, Katsuro Inoue:
Finding similar defects using synonymous identifier retrieval. IWSC 2010: 49-56

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