"Improve Yield and Quality Through Testability Analysis of VLSI Circuits."

David M. Wu, Charles E. Radke, C. C. Beh (1984)

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type: Conference or Workshop Paper

metadata version: 2002-11-22

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David M. Wu, Charles E. Radke, C. C. Beh:
Improve Yield and Quality Through Testability Analysis of VLSI Circuits. ITC 1984: 713-717

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