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"A Detailed Analysis of GOS Defects in MOS Transistors: Testing ..."
Jaume Segura et al. (1995)
- Jaume Segura, Carol de Benito, Antonio Rubio, Charles F. Hawkins:
A Detailed Analysis of GOS Defects in MOS Transistors: Testing Implications at Circuit Level. ITC 1995: 544-551
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