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"Efficient Scan Chain Design for Power Minimization During Scan Testing ..."

Yannick Bonhomme et al. (2003)

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DOI: 10.1109/TEST.2003.1270874

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/itc/BonhommeGGLP03
Yannick Bonhomme, Patrick Girard, Loïs Guiller, Christian Landrault, Serge Pravossoudovitch:
Efficient Scan Chain Design for Power Minimization During Scan Testing Under Routing Constraint. ITC 2003: 488-493

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