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"PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits."
Junhao Shi et al. (2005)
- Junhao Shi, Görschwin Fey, Rolf Drechsler, Andreas Glowatz, Friedrich Hapke, Jürgen Schlöffel:
PASSAT: Efficient SAT-Based Test Pattern Generation for Industrial Circuits. ISVLSI 2005: 212-217
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