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ORCID"Novel CMOS Scan Design for VLSI Testability."
Haomin Wu, Nan Zhuang, Marek A. Perkowski (1993)
- Haomin Wu, Nan Zhuang, Marek A. Perkowski:
Novel CMOS Scan Design for VLSI Testability. ISMVL 1993: 82-86
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