"Test Suite Reduction Based on Dependence Analysis."

Guy-Vincent Jourdan, Panitee Ritthiruangdech, Hasan Ural (2006)

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DOI: 10.1007/11902140_106

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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  - conf/iscis/JourdanRU06
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Guy-Vincent Jourdan, Panitee Ritthiruangdech, Hasan Ural:
Test Suite Reduction Based on Dependence Analysis. ISCIS 2006: 1021-1030

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