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"A two-step DDEM ADC for accurate and cost-effective DAC testing."

Hanqing Xing, Degang Chen, Randall L. Geiger (2005)

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DOI: 10.1109/ISCAS.2005.1465579

access: closed

type: Conference or Workshop Paper

metadata version: 2022-07-26

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Hanqing Xing, Degang Chen, Randall L. Geiger:
A two-step DDEM ADC for accurate and cost-effective DAC testing. ISCAS (5) 2005: 4289-4292

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