Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Cycling Induced Trap Generation and Recovery Near the Top Select Gate ..."

Xingqi Zou et al. (2019)

> Home

Details and statistics

DOI: 10.1109/IRPS.2019.8720607

access: closed

type: Conference or Workshop Paper

metadata version: 2022-08-25

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/ZouYJLXAZLWLSWC19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/ZouYJLXAZLWLSWC19
Xingqi Zou, Liang Yan, Lei Jin, Da Li, Feng Xu, Di Ai, An Zhang, Hongtao Liu, Ming Wang, Wei Li, Yali Song, Huazheng Wei, Yi Chen, Chunlong Li, Zongliang Huo:
Cycling Induced Trap Generation and Recovery Near the Top Select Gate Transistor in 3D NAND. IRPS 2019: 1-5

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.