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ORCID"Built-In Self Test for Low Cost Testing of a 60 MHz Synchronous Flash Memory."
Gaetano Palumbo et al. (2001)
- Gaetano Palumbo, Giuseppe Introvaia, Vincenzo Mastrocola, Promod Kumar, Francesco Pipiton:
Built-In Self Test for Low Cost Testing of a 60 MHz Synchronous Flash Memory. IOLTW 2001: 192-196
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