"An Automatically-Generated Run-Time Instrumenter to Reduce Coverage ..."

J. Jenny Li, David M. Weiss, Howell Yee (2008)

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DOI: 10.1145/1370042.1370054

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-14

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J. Jenny Li, David M. Weiss, Howell Yee:
An Automatically-Generated Run-Time Instrumenter to Reduce Coverage Testing Overhead. AST 2008: 49-56

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