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"Modelling and mitigation of time-zero variability in sub-16nm finfet-based ..."

Matthias Hartmann et al. (2014)

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DOI: 10.1145/2591513.2591573

access: closed

type: Conference or Workshop Paper

metadata version: 2020-12-29

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Matthias Hartmann, Halil Kükner, Prashant Agrawal, Praveen Raghavan, Liesbet Van der Perre, Wim Dehaene:
Modelling and mitigation of time-zero variability in sub-16nm finfet-based STT-MRAM memories. ACM Great Lakes Symposium on VLSI 2014: 243-244

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